Scanning transmission electron microscopy has become a
mainstream technique for imaging and analysis at atomic resolution
and sensitivity, and the authors of this book are widely credited
with bringing the field to its present popularity. Scanning
Transmission Electron Microscopy(STEM): Imaging and Analysis will
provide a comprehensive explanation of the theory and practice of
STEM from introductory to advanced levels, covering the instrument,
image formation and scattering theory, and definition and
measurement of resolution for both imaging and analysis. The
authors will present examples of the use of combined imaging and
spectroscopy for solving materials problems in a variety of fields,
including condensed matter physics, materials science, catalysis,
biology, and nanoscience. Therefore this will be a comprehensive
reference for those working in applied fields wishing to use the
technique, for graduate students learning microscopy for the first
time, and for specialists in other fields of microscopy.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!