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Resonant X-Ray Scattering in Correlated Systems (Paperback, Softcover reprint of the original 1st ed. 2017) Loot Price: R3,797

Discovery Miles 37 970

Repayment Terms: R356 pm x 12*

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Resonant X-Ray Scattering in Correlated Systems (Paperback, Softcover reprint of the original 1st ed. 2017): Youichi Murakami,...

Resonant X-Ray Scattering in Correlated Systems (Paperback, Softcover reprint of the original 1st ed. 2017)

Youichi Murakami, Sumio Ishihara

Series: Springer Tracts in Modern Physics, 269

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Loot Price R3,797 Discovery Miles 37 970 | Repayment Terms: R356 pm x 12*

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The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Tracts in Modern Physics, 269
Release date:	July 2018
First published:	2017
Editors:	Youichi Murakami • Sumio Ishihara
Dimensions:	235 x 155 x 13mm (L x W x T)
Format:	Paperback
Pages:	241
Edition:	Softcover reprint of the original 1st ed. 2017
ISBN-13:	978-3-662-57122-4
Categories:	Books > Science & Mathematics > Physics > States of matter > General Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	3-662-57122-6
Barcode:	9783662571224