Progress in Nanoscale Characterization and Manipulation (Hardcover, 1st ed. 2018)

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

General

Imprint:	Springer Verlag, Singapore
Country of origin:	Singapore
Series:	Springer Tracts in Modern Physics, 272
Release date:	September 2018
First published:	2018
Editors:	Rongming Wang • Chen Wang • Hongzhou Zhang • Jing Tao • Xuedong Bai
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	508
Edition:	1st ed. 2018
ISBN-13:	978-981-13-0453-8
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	981-13-0453-X
Barcode:	9789811304538

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