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Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization (Hardcover, 1st ed. 2018)
Loot Price: R5,257
Discovery Miles 52 570
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Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization (Hardcover, 1st ed. 2018)
Series: Springer Series in Surface Sciences, 65
Expected to ship within 12 - 17 working days
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This book provides a comprehensive introduction to the methods and
variety of Kelvin probe force microscopy, including technical
details. It also offers an overview of the recent developments and
numerous applications, ranging from semiconductor materials,
nanostructures and devices to sub-molecular and atomic scale
electrostatics. In the last 25 years, Kelvin probe force microscopy
has developed from a specialized technique applied by a few
scanning probe microscopy experts into a tool used by numerous
research and development groups around the globe. This sequel to
the editors' previous volume "Kelvin Probe Force Microscopy:
Measuring and Compensating Electrostatic Forces," presents new and
complementary topics. It is intended for a broad readership, from
undergraduate students to lab technicians and scanning probe
microscopy experts who are new to the field.
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