Books > Professional & Technical > Technology: general issues > Nanotechnology
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Noncontact Atomic Force Microscopy - Volume 2 (Hardcover, 2009 ed.)
Loot Price: R6,716
Discovery Miles 67 160
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Noncontact Atomic Force Microscopy - Volume 2 (Hardcover, 2009 ed.)
Series: NanoScience and Technology
Expected to ship within 10 - 15 working days
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Since the original publication of Noncontact Atomic Force
Microscopy in 2002, the noncontact atomic force microscope (NC-AFM)
has achieved remarkable progress. This second treatment deals with
the following outstanding recent results obtained with atomic
resolution since then: force spectroscopy and mapping with atomic
resolution; tuning fork; atomic manipulation; magnetic exchange
force microscopy; atomic and molecular imaging in liquids; and
other new technologies. These results and technologies are now
helping evolve NC-AFM toward practical tools for characterization
and manipulation of individual atoms/molecules and nanostructures
with atomic/subatomic resolution. Therefore, the book exemplifies
how NC-AFM has become a crucial tool for the expanding fields of
nanoscience and nanotechnology. Written for: Scientists,
practitioners, graduate students
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