Since the original publication of Noncontact Atomic Force
Microscopy in 2002, the noncontact atomic force microscope (NC-AFM)
has achieved remarkable progress. This second treatment deals with
the following outstanding recent results obtained with atomic
resolution since then: force spectroscopy and mapping with atomic
resolution; tuning fork; atomic manipulation; magnetic exchange
force microscopy; atomic and molecular imaging in liquids; and
other new technologies. These results and technologies are now
helping evolve NC-AFM toward practical tools for characterization
and manipulation of individual atoms/molecules and nanostructures
with atomic/subatomic resolution. Therefore, the book exemplifies
how NC-AFM has become a crucial tool for the expanding fields of
nanoscience and nanotechnology.
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