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Resonant X-Ray Scattering in Correlated Systems (Hardcover, 1st ed. 2017) Loot Price: R3,995
Discovery Miles 39 950
Repayment Terms: R374 pm x 12*
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Resonant X-Ray Scattering in Correlated Systems (Hardcover, 1st ed. 2017): Youichi Murakami, Sumio Ishihara

Resonant X-Ray Scattering in Correlated Systems (Hardcover, 1st ed. 2017)

Youichi Murakami, Sumio Ishihara

Series: Springer Tracts in Modern Physics, 269

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Loot Price R3,995 Discovery Miles 39 950 | Repayment Terms: R374 pm x 12*

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The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Tracts in Modern Physics, 269
Release date: 2017
First published: 2017
Editors: Youichi Murakami • Sumio Ishihara
Dimensions: 235 x 155 x 16mm (L x W x T)
Format: Hardcover
Pages: 241
Edition: 1st ed. 2017
ISBN-13: 978-3-662-53225-6
Categories: Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 3-662-53225-5
Barcode: 9783662532256

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