This book fills in details that are often left out of modern books on the theory of antennas. The starting point is a discussion of some general principles that apply to all electronic systems and to antennas in particular. Just as time domain functions can be expanded in terms of sine waves using Fourier transforms, spatial domain functions can be expanded in terms of plane waves also using Fourier transforms, and K-space gain is the spatial Fourier transform of the aperture weighting function. Other topics discussed include the Discrete Fourier Transform (DFT) formulation of antenna gain and what is missing in this formulation, the effect of sky temperature on the often specified G/T ratio of antennas, sidelobe control using conventional and novel techniques, and ESA digital beamforming versus adaptive processing to limit interference. Presents content the author derived when first asked to evaluate the performance of an electronically scanned array under design with manufacturing imperfections and design limitations; Enables readers to understand the firm theoretical foundation of antenna gain even when they must start from well-known formulations rather than first principles; Explains in a straightforward manner the relationship between antenna gain and aperture area; Discusses the relationship between sidelobe control algorithms and aperture shape, how to take advantage of it, and what the penalties are; Shows the equivalence of Minimum-Variance, Distortionless Response (MVDR) and Space-Time Adaptive Processing (STAP) and how these algorithms can be used with ESA subarrays to mitigate interference.

Kularatna's new book describes modern component families and how to design circuit blocks using them. While much of this information may be available elsewhere, in Modern Component Families and Circuit Block Design it is integrated with additional design hints that are unique. The discussion covers most components necessary in an embedded design or a DSP-based real time system design. The chapter on modern semi-conductor sensors allows system designers to use the latest sensor ICs for real-world physical parameter sensing.
*Covers the most recent low-power components
*Written by an authority on power electronics
*Includes extensive illustrations and references

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.
The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise.
Key Features
* Discusses reliability and failure on both the chip and packaging levels
* Handles the role of defects in yield and reliability
* Includes a tutorial chapter on the mathematics of reliability
* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints
* Considers defect detection methods and failure analysis techniques

This thesis explores several fundamental topics in mesoscopic circuitries that incorporate few electronic conduction channels. It reports a series of long-awaited experiments that establish a new state of the art. The first experiments address the quantized character of charge in circuits. We demonstrate the charge quantization criterion, observe the predicted charge quantization scaling and a crossover toward a universal behavior as temperature is increased. The second set of experiments addresses the unconventional quantum critical physics that arises in the multichannel Kondo model. We observe the predicted universal Kondo fixed points and validate the numerical renormalization group scaling curves. Away from the quantum critical point, we obtain a direct visualization of the development of a second-order quantum phase transition.

This book provides a single-source reference to the state-of-the-art in logic synthesis. Readers will benefit from the authors' expert perspectives on new technologies and logic synthesis, new data structures, big data and logic synthesis, and convergent logic synthesis. The authors describe techniques that will enable readers to take advantage of recent advances in big data techniques and frameworks in order to have better logic synthesis algorithms.

This book discusses a number of important topical technical and non-technical issues related to the global energy, environment and socio-economic developments for professionals and students directly and indirectly involved in the relevant fields. It shows how renewable energy offers solutions to mitigate energy demand and helps achieve a clean environment, and also addresses the lack of a clear vision in the development of technology and a policy to reach the mandatory global renewable energy targets to reduce greenhouse gas emissions and stimulate socio-economic development. The book is structured in such a way that it provides a consistent compilation of fundamental theories, a compendium of current research and development activities as well as new directions to overcome critical limitations; future technologies for power grids and their control, stability and reliability are also presented.

This book focuses on conceptual frameworks that are helpful in understanding the basics of electronics - what the feedback system is, the principle of an oscillator, the operational working of an amplifier, and other relevant topics. It also provides an overview of the technologies supporting electronic systems, like OP-AMP, transistor, filter, ICs, and diodes. It consists of seven chapters, written in an easy and understandable language, and featuring relevant block diagrams, circuit diagrams, valuable and interesting solved examples, and important test questions. Further, the book includes up-to-date illustrations, exercises, and numerous worked examples to illustrate the theory and to demonstrate their use in practical designs.

This book is based on the 18 tutorials presented during the 28th workshop on Advances in Analog Circuit Design. Expert designers present readers with information about a variety of topics at the frontier of analog circuit design, including next-generation analog-to-digital converters , high-performance power management systems and technology considerations for advanced IC design. For anyone involved in analog circuit research and development, this book will be a valuable summary of the state-of-the-art in these areas. Provides a summary of the state-of-the-art in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of next-generation analog-to-digital converters, high-performance power management systems, and technology considerations for advanced IC design.

Simplified Design of Data Converters shows how to design and experiment with data converters, both analog-to-digital and digital to analog. The design approach here is the same one used in all of John Lenk's best-selling books on simplified and practical design. Throughout the book, design problems start with guidelines for selecting all components on a trial-value basis, assuming a specific design goal and set of conditions. Then, using the guideline values in experimental circuits, the desired results are produced by varying the experimental component values, if needed.
If you are a working engineer responsible for designing data-converters circuits, or selecting IC data converters, the variety of circuit configurations described here should generally simplify your task. Not only does the book describe converter-circuit designs, but it also covers the most popular forms of data-converter ICs available. Throughout the book, you will find a wealth of information on data-converter ICs and related components.
For all skill levels.
Tells how to design and build data-converter circuits from scratch.

The book focuses on system dependability modeling and calculation, considering the impact of s-dependency and uncertainty. The best suited approaches for practical system dependability modeling and calculation, (1) the minimal cut approach, (2) the Markov process approach, and (3) the Markov minimal cut approach as a combination of (1) and (2) are described in detail and applied to several examples. The stringently used Boolean logic during the whole development process of the approaches is the key for the combination of the approaches on a common basis. For large and complex systems, efficient approximation approaches, e.g. the probable Markov path approach, have been developed, which can take into account s-dependencies be-tween components of complex system structures. A comprehensive analysis of aleatory uncertainty (due to randomness) and epistemic uncertainty (due to lack of knowledge), and their combination, developed on the basis of basic reliability indices and evaluated with the Monte Carlo simulation method, has been carried out. The uncertainty impact on system dependability is investigated and discussed using several examples with different levels of difficulty. The applications cover a wide variety of large and complex (real-world) systems. Actual state-of-the-art definitions of terms of the IEC 60050-192:2015 standard, as well as the dependability indices, are used uniformly in all six chapters of the book.

This is the only book on the market that has been conceived and deliberately written as a one-semester text on basic electric circuit theory. As such, this book employs a novel approach to the exposition of the material in which phasors and ac steady-state analysis are introduced at the beginning. This allows one to use phasors in the discussion of transients excited by ac sources, which makes the presentation of transients more comprehensive and meaningful. Furthermore, the machinery of phasors paves the road to the introduction of transfer functions, which are then used in the analysis of transients and the discussion of Bode plots and filters. Another salient feature of the text is the consolidation into one chapter of the material concerned with dependent sources and operational amplifiers. Dependent sources are introduced as linear models for transistors on the basis of small signal analysis. In the text, PSpice simulations are prominently featured to reinforce the basic material and understanding of circuit analysis.
Key Features
* Designed as a comprehensive one-semester text in basic circuit theory
* Features early introduction of phasors and ac steady-state analysis
* Covers the application of phasors and ac steady-state analysis
* Consolidates the material on dependent sources and operational amplifiers
* Places emphasis on connections between circuit theory and other areas in electrical engineering
* Includes PSpice tutorials and examples
* Introduces the design of active filters
* Includes problems at the end of every chapter
* Priced well below similar books designed for year-long courses

This book covers basic fundamentals of logic design and advanced RTL design concepts using VHDL. The book is organized to describe both simple and complex RTL design scenarios using VHDL. It gives practical information on the issues in ASIC prototyping using FPGAs, design challenges and how to overcome practical issues and concerns. It describes how to write an efficient RTL code using VHDL and how to improve the design performance. The design guidelines by using VHDL are also explained with the practical examples in this book. The book also covers the ALTERA and XILINX FPGA architecture and the design flow for the PLDs. The contents of this book will be useful to students, researchers, and professionals working in hardware design and optimization. The book can also be used as a text for graduate and professional development courses.

This book uses motivating examples and real-life attack scenarios to introduce readers to the general concept of fault attacks in cryptography. It offers insights into how the fault tolerance theories developed in the book can actually be implemented, with a particular focus on a wide spectrum of fault models and practical fault injection techniques, ranging from simple, low-cost techniques to high-end equipment-based methods. It then individually examines fault attack vulnerabilities in symmetric, asymmetric and authenticated encryption systems. This is followed by extensive coverage of countermeasure techniques and fault tolerant architectures that attempt to thwart such vulnerabilities. Lastly, it presents a case study of a comprehensive FPGA-based fault tolerant architecture for AES-128, which brings together of a number of the fault tolerance techniques presented. It concludes with a discussion on how fault tolerance can be combined with side channel security to achieve protection against implementation-based attacks. The text is supported by illustrative diagrams, algorithms, tables and diagrams presenting real-world experimental results.

This book presents the state-of-the art of one of the main concerns with microprocessors today, a phenomenon known as "dark silicon". Readers will learn how power constraints (both leakage and dynamic power) limit the extent to which large portions of a chip can be powered up at a given time, i.e. how much actual performance and functionality the microprocessor can provide. The authors describe their research toward the future of microprocessor development in the dark silicon era, covering a variety of important aspects of dark silicon-aware architectures including design, management, reliability, and test. Readers will benefit from specific recommendations for mitigating the dark silicon phenomenon, including energy-efficient, dedicated solutions and technologies to maximize the utilization and reliability of microprocessors.

This book provides readers with an in-depth discussion of circuit simulation, combining basic electrical engineering circuit theory with Python programming. It fills an information gap by describing the development of Python Power Electronics, an open-source software for simulating circuits, and demonstrating its use in a sample circuit. Unlike typical books on circuit theory that describe how circuits can be solved mathematically, followed by examples of simulating circuits using specific, commercial software, this book has a different approach and focus. The author begins by describing every aspect of the open-source software, in the context of non-linear power electronic circuits, as a foundation for aspiring or practicing engineers to embark on further development of open source software for different purposes. By demonstrating explicitly the operation of the software through algorithms, this book brings together the fields of electrical engineering and software technology.

This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching devices besides sensitive control, protection and signal processing circuits. The injection of parasitic charges leads to the activation of substrate bipolar transistors. This book explores how these events can be evaluated for a wide range of circuit topologies. To this purpose, new generalized devices implemented in Verilog-A are used to model the substrate with standard circuit simulators. This approach was able to predict for the first time the activation of a latch-up in real circuits through post-layout SPICE simulation analysis. Discusses substrate modeling and circuit-level simulation of parasitic bipolar device coupling effects in integrated circuits; Includes circuit back-annotation of the parasitic lateral n-p-n and vertical p-n-p bipolar transistors in the substrate; Uses Spice for simulation and characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices; Offers design guidelines to reduce couplings by adding specific protections.

Radio Frequency and Microwave Power Amplifiers are finding an increasingly broad range of applications, particularly in communications and broadcasting, but also in the industrial, medical, automotive, aviation, military, and sensing fields. Each application has its own design specifications, for example, high linearity in modern communication systems or high efficiency in broadcasting, and, depending on process technology, capability to operate efficiently at very high frequencies, such as 77 GHz and higher for automotive radars. Advances in design methodologies have practical applications in improving gain, power output, bandwidth, power efficiency, linearity, input and output impedance matching, and heat dissipation. This essential reference presented in two volumes aims to provide comprehensive, state-of-the-art coverage of RF and microwave power amplifier design with in-depth descriptions of current and potential future approaches. Volume 1 covers principles, device modeling and matching networks, while volume 2 focuses specifically on efficiency and linearity enhancement techniques. The volumes will be of particular interest to engineers and researchers engaged in RF and microwave amplifier design, and those who are interested in systems incorporating RF and microwave amplifiers.

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.
This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.
Key Features
* Chapter one itself is a comprehensive review of MOS device physics which allows a reader with little background in MOS devices to pick up a sufficient amount of information to be able to follow the rest of the book
* The book is written to allow the reader to learn about MOS Device Reliability in a relatively short amount of time, making the texts detailed treatment of hot-carrier effects especially useful and instructive to both researchers and others with varyingamounts of experience in the field
* The logical organization of the book begins by discussing known principles, then progresses to empirical information and, finally, to practical solutions
* Provides the most complete review of device degradation mechanisms as well as drain engineering methods
* Contains the most extensive reference list on the subject

This volume builds on the author's previous work, "RF Power Amplifiers for Wireless Communications", offering experienced engineers a more in-depth understanding of the theory and design of RF power amplifiers. A useful reference tool for RF-, digital- and system-level designers, the book includes discussions on the most critical topics for professionals in the field, including envelope power management schemes and linearization. This book should be of interest to RF- and microwave-design engineers in wireless communications, as well as digital- and system-level engineers in satellite communications.

This book describes the integrated circuit supply chain flow and discusses security issues across the flow, which can undermine the trustworthiness of final design. The author discusses and analyzes the complexity of the flow, along with vulnerabilities of digital circuits to malicious modifications (i.e. hardware Trojans) at the register-transfer level, gate level and layout level. Various metrics are discussed to quantify circuit vulnerabilities to hardware Trojans at different levels. Readers are introduced to design techniques for preventing hardware Trojan insertion and to facilitate hardware Trojan detection. Trusted testing is also discussed, enabling design trustworthiness at different steps of the integrated circuit design flow. Coverage also includes hardware Trojans in mixed-signal circuits.

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

Analog electronics is the simplest way to start a fun, informative, learning program. Beginning Analog Electronics Through Projects, Second Edition was written with the needs of beginning hobbyists and students in mind. This revision of Andrew Singmin's popular Beginning Electronics Through Projects provides practical exercises, building techniques, and ideas for useful electronics projects. Additionally, it features new material on analog and digital electronics, and new projects for troubleshooting test equipment.
Published in the tradition of Beginning Electronics Through Projects and Beginning Digital Electronics Through Projects, this book limits theory to "need-to-know" information that will allow you to get started right away without complex math. Commonly used electronic components and their functions are described briefly in everyday terms. Ideal for progressive learning, each of the projects builds on the theory and component knowledge developed in earlier chapters. Step-by-step instructions facilitate one's learning of techniques for component identification, soldering, troubleshooting, and much more.
Includes instructions for using a general purpose assembly board
Practical, enjoyable, useful approach to learning about electronics
Features twelve easy and useful projects designed to familiarize beginners and hobbyists with the most commonly used ICs.