This updated and revised edition of a classic work provides a
summary of methods for numerical computation of high resolution
conventional and scanning transmission electron microscope images.
At the limits of resolution, image artifacts due to the instrument
and the specimen interaction can complicate image interpretation.
Image calculations can help the user to interpret and understand
high resolution information in recorded electron micrographs. The
book contains expanded sections on aberration correction, including
a detailed discussion of higher order (multipole) aberrations and
their effect on high resolution imaging, new imaging modes such as
ABF (annular bright field), and the latest developments in parallel
processing using GPUs (graphic processing units), as well as
updated references. Beginning and experienced users at the advanced
undergraduate or graduate level will find the book to be a unique
and essential guide to the theory and methods of computation in
electron microscopy.
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