Provides a comprehensive guide to measurements with lasers Examines the design of optical and laser-based instruments Reviews the development of measurement strategies Includes two new chapters on self-mixing interferometry and quantum sensing Includes end of chapter problems

Showcasing the most influential developments, experiments, and architectures impacting the digital, surveillance, automotive, industrial, and medical sciences, Image Processing Technologies tracks the evolution and advancement of computer vision and image processing (CVIP) technologies, examining methods and algorithms for image analysis, optimization, segmentation, and restoration. It focuses on recent approaches and techniques in CVIP applications development and explores various coding methods for individual types of 3-D images. This text/reference brings researchers and specialists up-to-date on the latest innovations affecting multiple image processing environments.

Comprising specially selected papers on the subject of Computational Methods and Experimental Measurements, this book includes research from scientists, researchers and specialists who perform experiments, develop computer codes and carry out measurements on prototypes. Improvements relating to computational methods have generated an ever-increasing expansion of computational simulations that permeate all fields of science and technology. Validating the results of these improvements can be achieved by carrying out committed and accurate experiments, which have undertaken continuous development. Current experimental techniques have become more complex and sophisticated so that they require the intensive use of computers, both for running experiments as well as acquiring and processing the resulting data. This title explores new experimental and computational methods and covers various topics such as: Computer-aided Models; Image Analysis Applications; Noise Filtration of Shockwave Propagation; Finite Element Simulations.

The ability to arrange precisely designed patterns of nanoparticles into a desired spatial configuration is the key to creating novel nanoscale devices that take advantage of the unique properties of nanomaterials. While two-dimensional arrays of nanoparticles have been demonstrated successfully by various techniques, a controlled way of building ordered arrays of three-dimensional (3D) nanoparticle structures remains challenging. This book describes a new technique called the 'nanoscopic lens' which is able to produce a variety of 3D nano-structures in a controlled manner. This ebook describes the nanoscopic lens technique and how it can serve as the foundation for device development that is not limited to a variety of optical, magnetic and electronic devices, but can also create a wide range of bio-nanoelectronic devices.

This reference is a guide to the concepts, technology, uses, costs and vocabulary of fractional T-1 services. The book illustrates fractional T-1 capabilities and limitations by explaining basic T-1 networking, common fractional T-1 access methods, equipment interfacing and troubleshooting. The text describes the advantages to be gained with these services, the various service alternatives and the cost/benefit considerations.

Tbis book is basicaUy concemed with approaches for improving safety in man-made systems. We caU these approaches, coUectively, fault monitoring, since they are concemed primarily with detecting faults occurring in the components of such systems, being sensors, actuators, controUed plants or entire strucutures. The common feature of these approaches is the intention to detect an abrupt change in some characteristic property of the considered object, by monitoring the behavior of the system. This change may be a slow-evolving effect or a complete breakdoWD. In tbis sense, fault monitoring touches upon, and occasionaUy overIaps with, other areas of control engineering such as adaptive control, robust controller design, reIiabiIity and safety engineering, ergonomics and man-macbine interfacing, etc. In fact, a system safety problem, could be attacked from any of the above angles of view. In tbis book, we don't touch upon these areas, unless there is a strong relationship between the fauIt monitoring approaches discussed and the aforementioned fields. When we set out to write tbis book, our aim was to incIude as much material as possible in a most rigorous, unified and concise format. Tbis would incIude state-of-the-art method as weil as more cIassical techniques, stilI in use today. AB we proceeded in gathering material, however, it soon became apparent that these were contradicting design criteria and a trade-off had to be made. We believe that the completeness vs.

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Besides giving an historical introduction to embankment dams the book describes the need for instrumentation, planning procurement and installation practices of instruments. The significance of visual inspection and techniques, of monitoring various parameters, seepage, pore pressure, surface and internal displacements, earth pressures and seismic behaviour, through instrumentation has been described. Collection and processing of data and their use for back analysis to check stability of a dam at various stages of construction and reservoir filling have been suggested. In addition to case histories quoted in various chapters, an exclusive chapter on select case histories has been added which describes the conventional and latest instruments that are being used and methods adopted for installation, monitoring and analyses of data.

It is generally acknowledged that modeling and simulation are preferred alternatives to trial and error approaches to semiconductor fabrication in the present environment, where the cost of process runs and associated mask sets is increasing exponentially with successive technology nodes. Hence, accurate physical device simulation tools are essential to accurately predict device and circuit performance. Accurate thermal modelling and the design of microelectronic devices and thin film structures at the micro- and nanoscales poses a challenge to electrical engineers who are less familiar with the basic concepts and ideas in sub-continuum heat transport. This book aims to bridge that gap. Efficient heat removal methods are necessary to increase device performance and device reliability. The authors provide readers with a combination of nanoscale experimental techniques and accurate modelling methods that must be employed in order to determine a device's temperature profile.

Maintaining an optimal blend of theory and practice, this readily accessible reference/text details the utility of system dynamics for analysis and design of mechanical, electrical, fluid, thermal, and "mixed" engineering systems-addressing topics from system elements and simple first- and second-order systems to complex lumped- and distributed-parameter models of practical machines and processes. Emphasizing digital simulation and integrating frequency-response methods throughout, System Dynamics furnishes up-to-date and thorough discussions on relations between real system components and ideal math models continuous-time dynamic system simulation methods, such as MATLAB/SIMULINK analytical techniques, such as classical D-operator and Laplace transform methods for differential equation solutions and linearization methods vibration, electromechanics, and mechatronics Fourier spectrum treatment of periodic functions, and transients and much more System Dynamics also contains a host of self-study and pedagogical features that will make it a useful companion for years to come, such as easy-to-understand simulation diagrams and results applications to real-life systems--including actual industrial hardware intentional use of nonlinearity to achieve optimal designs numerous end-of-chapter problems and worked examples over 1425 graphs, equations, and drawings throughout the text the latest references to key sources in the literature Serving as a foundation for engineering experience, System Dynamics is a valuable reference for mechanical, system, control/instrumentation, and sensor/actuator engineers as well as an indispensable textbook for undergraduate students taking courses such as Dynamic Systems in departments of mechanical, aerospace, electrical, agricultural, and industrial engineering and engineering physics.

This book reviews the advances in data gathering and processing in the biotech laboratory environment, and it sheds new lights on the various aspects that are necessary for the implementation of intelligent laboratory architecture and infrastructure. Smart technologies are increasingly dominating our everyday lives and have become an indispensable part of the industrial environment. The laboratory environment, which has long been rather conservative, has also set out to adapt smart technologies with regards to Industry 4.0 and the Internet of Things (IoT) for the laboratory. Due to the heterogeneity of the existing infrastructure and the often complex work processes, standardization is slow, e.g. to implement device interfaces or standardized driver protocols, which are urgently needed to generate standardized data streams that would be immanent for post-processing of data. Divided into 9 chapters, this book offers an authoritative overview of the diverse aspects in the generation and recording of uniform data sets in the laboratory, and in the processing of the data and enabling seamless processing towards machine learning and artificial intelligence. In the first part of the book, readers will find more about high throughout systems, automation, robotics, and the evolution of technology in the laboratory. The second part of the book is devoted to standardization in lab automation, in which readers will learn more about some regulatory aspects, the SiLA2 standards, the OPC LADS (Laboratory and Analytical Device Standard), and FAIR Data infrastructure

Discussing the design and optimum use of thermal analysis instrumentation for materials' property measurement, this work details how the instruments work, what they measure, potential pitfalls and the fitting of experimental results to theoretical models. It presents a tutorial on writing computer programs for data manipulation, advanced thermoanalytical methods and case studies.

The world of artificial systems is reaching hitherto undreamed-of levels of complexity. Surface traffic, electricity distribution, mobile communications, etc., demonstrate that problems are arising that are beyond classical scientific or engineering knowledge. In order that our ability to control such systems should not be hindered by lack of comprehension, there is an on-going effort to understand them.This book is an example of the types of approach that European researchers are using to tackle problems derived from systems' complexity. It has grown out of activities in the Control of Complex Systems (COSY) research program the goals of which are to promote multi-disciplinary activity leading to a deeper understanding and further development of control technologies for complex systems and if possible, to develop the theory underlying such systems. The material in this book represents a selection of the results of the COSY program and is organised as a collection of essays of varying nature: surveys of essential areas, discussion of specific problems, case studies, and benchmark problems.Topics covered include:Modelling complex physical systems;Passivity-based control of non-linear systems;Aspects of fault identification and fault tolerance;Control design;Learning control;Satellite attitude control.Complex systems appear in many different fields and for this reason this book should be of interest to scientists, researchers and industrial engineers with a broad spectrum of experience.

Measurement and Instrumentation: Theory and Application, Third Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. Providing the most balanced coverage of measurement theory/technologies and instrumentation, this clearly and comprehensively written text arms students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application.

This text provides a comprehensive introduction to the principles of industrial control and instrumentation. The author not only outlines the basic concepts and terminology of measurement and control systems, he also discusses in detail the elements used to build up such systems. As well as a final consideration of measurement and control systems, each chapter concludes with relevant problems in order that students can test their newly acquired knowledge as they progress. Students studying for BTEC National Certificate and Diploma courses in electrical and electronic, communications and computer engineering will find that their course requirements are more than satisfied by this comprehensive text.

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.